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Scanning electron microscope
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161	Nanotechnology Solutions Partner Park Systems Singapore. 33, Ubi Avenue 3, #07-47 Vertex Tower A SingaporeTel: +Mobile: +www.parkAFM.com © 2011 Park Systems Corp. All rights reserved. Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Intermolecular forces Chemistry Atomic force microscopy Nanotechnology Park Systems Scanning electron microscope Nanometrology Vibrational analysis with scanning probe microscopy Magnetic force microscope Scientific method Science Scanning probe microscopy
162	Microsoft Word - WITec_TESCAN_PressRelease_Prism_Award_2015_RISE_feb2015_EN.doc Add to Reading List Source URL: www.witec.de Language: English - Date: 2015-02-19 11:59:09 Microbiology Microscopy Microscopes Electron microscope Optical microscope Focused ion beam Scanning electron microscope Confocal microscopy Characterization Scientific method Electron microscopy Science
163	QUANTAX FlatQUAD EDS for SEM with the XFlash® FlatQUAD Innovation with Integrity EDS Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2014-09-26 04:50:28 Electron microscopy Spectroscopy Microscopes Nanomaterials Nanoparticle Nanotechnology X-ray Scanning electron microscope Electron microscope Scientific method Science Electromagnetic radiation
164	Automatic mosaicking and volume assembly for high-throughput serial-section transmission electron microscopy Add to Reading List Source URL: prometheus.med.utah.edu Language: English - Date: 2014-07-26 20:22:53 Connectomics Connectome Transmission electron microscopy Electron microscope Electron tomography Microscopy Tomography Microscope Serial block-face scanning electron microscopy Scientific method Electron microscopy Science
165	PDF Document Add to Reading List Source URL: www.jetro.go.jp Language: English - Date: 2014-12-26 02:52:01 Physics Transmission electron microscopy Electron microscope Microscope Nanotechnology Focused ion beam Optical microscope Scanning electron microscope Characterization Scientific method Electron microscopy Science
166	Strong-field phenomena in silicon nanoplasmonic waveguides Abdulhakem Elezzabi, Shawn Sederberg, and Shawn Greig Add to Reading List Source URL: spie.org Language: English - Date: 2015-04-20 03:43:59 Condensed matter physics Charge carriers Electron microscopy Silicon Silicon photonics Electron Laser Diode Scanning electron microscope Physics Optics Photonics
167	Hi-tech INDUSTRIAL FLAW DETECTION AND NON-DESTRUCTIVE DIAGNOSTIC: A NEW APPROACH Viktor BYKOV, General Director, JSC NTI Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2011-05-12 08:56:19 Scanning probe microscopy Microscopy Intermolecular forces Materials science Atomic force microscopy Nanotechnology Microscope Optical microscope Electron microscope Science Scientific method Chemistry
168	MMR Technologies, Inc. SEM Thermal Stage System Product Description MMR Technologies’ SEM Cold Stage System, Model K2600, is designed to mount on the specimen stage of Add to Reading List Source URL: connect.physicsworld.com Language: English - Date: 2013-05-07 05:55:13 Physics Heat pumps Cryogenics Cold Temperature Scanning electron microscope Electron microscope Refrigerator Scientific method Electron microscopy Science
169	Biogeosciences, 12, 825–834, 2015 www.biogeosciences.netdoi:bg © Author(sCC Attribution 3.0 License. Insight into Emiliania huxleyi coccospheres by focused ion beam Add to Reading List Source URL: www.biogeosciences.net Language: English - Date: 2015-02-11 02:30:02 Electron microscopy Matter Coccolith Emiliania huxleyi Focused ion beam Emiliania Cretaceous Scanning electron microscope Transmission electron microscopy Chemistry Haptophytes Scientific method
170	Press Release Press Release Press Release Add to Reading List Source URL: www.leica-microsystems.com Language: English - Date: 2014-11-20 03:50:01 Leica Leica Microsystems Leica Camera Electron microscope Scanning electron microscope Microscope Scientific method Electron microscopy Science

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